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Advanced and cost effective solution
Advanced design, simulation, and analysis for optical and opto-mechanical manufacturability
Production manufacturing from first articles to high volumes and every procedure of development in between
Cost effective solution
Manufacturing and Assembly
Robust, redundant, and ISO 9001 certified manufacturing capabilities
Engineering, design, and manufacturing and assembly, closed loop production
Volume manufacturing for OEM application integration
Measurement parameters | EFL, R, Center Deviation, FFL, BFL, MTF, Wedge Angle (Parallelism) |
EFL test range | +1 ~ +2000mm -1 ~ -1500mm |
EFL measurement accuracy | 0.03% ~ 0.30% |
R,BFL test range | ±1mm ~ ±750mm |
R BFL measurement accuracy | 0.05% ~ 0.30% |
Center Deviation Test Range | ±1mm ~ ±2000mm |
Center deviation measurement accuracy | ±0.2um or ±2 arcsec |
Wedge angle (parallelism) measurement accuracy | ±1 arcsec |
Applications and Measurements | Contact spherical curvature radius measurement |
Curvature radius test range | L±6mm ~ ∞ |
Diameter of sample to be tested | 10 ~ 500mm |
Curvature Radius Measurement Accuracy | 0.005% |
Linear encoder working distance | ±30mm |
Linear encoder absolute accuracy |
0.05um |
Measurement mode | Reflection method to measure the angle between any two adjacent polished surfaces of a prism |
Measuring range | 0 ~ 360° |
Measurement accuracy |
Single measurement: 0.50" Multiple measurements: 0.20" |
Rotary encoder resolution | 0.036” |
Rotary encoder accuracy | 0.20” |
Standard lens diameter | 100mm |
Flat Standard Lens Accuracy | Lambda/20 @ 633nm |
Measurement repeatability | Lambda/100 @ 633nm |
Spherical standard lens F-number | F/0.65, F/1.6, F/3.3, F/7.0,F/1.0,F/10.7 |
Spherical Standard Lens Accuracy | Lambda/10 @ 633nm |
Applications and Measurements | Transmittance and reflectance measurement of planar components |
wavelength range | UV/VIS/IR (185nm ~ 3300nm) |
UVVis sub-band resolution | ≤0.05nm |
Infrared band resolution | ≤0.20nm |
Stray light@220nm& 340nm&370nm | ≤0.00007%T |
wavelength repeatability | ≤0.20nm |