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Waveplates
Capabilities
Whether you require small quantities for prototyping or build-to-print high volume for OEM systems, we have the waveplate manufacturing capabilities to ensure the success of your project.
| Material: | Quartz Crystal |
| Wavefront Distortion : | up to wave/10 @ 632.8nm |
| Retardation Tolerance: | wave/500 |
| Parallelism: | < 1 arcsec. |
| Surface Quality: | up to 10-5 |
| Clear Aperture: | >90% |
| Coating: | upon requirement, high LIDT available |
| Type | Feature | |
| Zero Order | Cemented | Cemented by glue |
| Better Temperature Bandwidth | ||
| Wide Wavelength Bandwidth | ||
| Moderate damage threshold | ||
| Optical Contacted | No glue | |
| Better Temperature Bandwidth | ||
| Wide Wavelength Bandwidth | ||
| Better damage threshold | ||
| Good wavefront and parallelism | ||
| Air Spaced | No glue, Mounted | |
| Better Temperature Bandwidth | ||
| Wide Wavelength Bandwidth | ||
| High damage threshold | ||
| True Zero Order | Cemented | Cemented by glue |
| Better Temperature Bandwidth | ||
| Wide Wavelength Bandwidth | ||
| Moderate damage threshold | ||
| Excellent retardation performance | ||
| Single Plate | Single plate | |
| Better Temperature Bandwidth | ||
| Wide Wavelength Bandwidth | ||
| High damage threshold | ||
| Only 1310nm, 1550nm available | ||
| Multi Order | Low Temperature Bandwidth | |
| Low Wavelength Bandwidth | ||
| High damage threshold | ||
| Low cost | ||
| Achromatic | Better Temperature Bandwidth | |
| Very broad Wavelength Bandwidth | ||
| Cemented and air spaced available | ||
Optical Measurement Equipments
OptiSpheric 2000 AF
| Measurement parameters | EFL, R, Center Deviation, FFL, BFL, MTF, Wedge Angle (Parallelism) |
| EFL test range | +1 ~ +2000mm -1 ~ -1500mm |
| EFL measurement accuracy | 0.03% ~ 0.30% |
| R,BFL test range | ±1mm ~ ±750mm |
| R BFL measurement accuracy | 0.05% ~ 0.30% |
| Center Deviation Test Range | ±1mm ~ ±2000mm |
| Center deviation measurement accuracy | ±0.2um or ±2 arcsec |
| Wedge angle (parallelism) measurement accuracy | ±1 arcsec |
Ultra-Spherotronic
| Applications and Measurements | Contact spherical curvature radius measurement |
| Curvature radius test range | L±6mm ~ ∞ |
| Diameter of sample to be tested | 10 ~ 500mm |
| Curvature Radius Measurement Accuracy | 0.005% |
| Linear encoder working distance | ±30mm |
| Linear encoder absolute accuracy |
0.05um |
Ultra-Spherotronic
| Measurement mode | Reflection method to measure the angle between any two adjacent polished surfaces of a prism |
| Measuring range | 0 ~ 360° |
| Measurement accuracy |
Single measurement: 0.50" Multiple measurements: 0.20" |
| Rotary encoder resolution | 0.036” |
| Rotary encoder accuracy | 0.20” |
Interferometer Zygo GPI
| Standard lens diameter | 100mm |
| Flat Standard Lens Accuracy | Lambda/20 @ 633nm |
| Measurement repeatability | Lambda/100 @ 633nm |
| Spherical standard lens F-number | F/0.65, F/1.6, F/3.3, F/7.0,F/1.0,F/10.7 |
| Spherical Standard Lens Accuracy | Lambda/10 @ 633nm |
Spectrophotometer Lambda 950
| Applications and Measurements | Transmittance and reflectance measurement of planar components |
| wavelength range | UV/VIS/IR (185nm ~ 3300nm) |
| UVVis sub-band resolution | ≤0.05nm |
| Infrared band resolution | ≤0.20nm |
| Stray light@220nm& 340nm&370nm | ≤0.00007%T |
| wavelength repeatability | ≤0.20nm |
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