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Mirror | |
Attribute | Manufacturing Capabilities |
Dimensions | 3.0 - 400.0mm |
Material of substrates | Optical glass, Fused silica, Zerodur, Metal |
Coating types | Metal, Dielectric, Hybrid, etc |
Spectrum Range | From UV to 16um |
Reflection (%) | up to 99.6% |
Surface Quality (Scratch Dig) | up to 10-5 |
LIDT | up to 20J/cm2 at 1064 nm, 10 ns, 10 Hz |
Surface Figure (before coating) | up to 0.05 wave (P-V) |
Surface Roughness (rms,before coating) | up 0.3Å |
Measurement parameters | EFL, R, Center Deviation, FFL, BFL, MTF, Wedge Angle (Parallelism) |
EFL test range | +1 ~ +2000mm -1 ~ -1500mm |
EFL measurement accuracy | 0.03% ~ 0.30% |
R,BFL test range | ±1mm ~ ±750mm |
R BFL measurement accuracy | 0.05% ~ 0.30% |
Center Deviation Test Range | ±1mm ~ ±2000mm |
Center deviation measurement accuracy | ±0.2um or ±2 arcsec |
Wedge angle (parallelism) measurement accuracy | ±1 arcsec |
Applications and Measurements | Contact spherical curvature radius measurement |
Curvature radius test range | L±6mm ~ ∞ |
Diameter of sample to be tested | 10 ~ 500mm |
Curvature Radius Measurement Accuracy | 0.005% |
Linear encoder working distance | ±30mm |
Linear encoder absolute accuracy |
0.05um |
Measurement mode | Reflection method to measure the angle between any two adjacent polished surfaces of a prism |
Measuring range | 0 ~ 360° |
Measurement accuracy |
Single measurement: 0.50" Multiple measurements: 0.20" |
Rotary encoder resolution | 0.036” |
Rotary encoder accuracy | 0.20” |
Standard lens diameter | 100mm |
Flat Standard Lens Accuracy | Lambda/20 @ 633nm |
Measurement repeatability | Lambda/100 @ 633nm |
Spherical standard lens F-number | F/0.65, F/1.6, F/3.3, F/7.0,F/1.0,F/10.7 |
Spherical Standard Lens Accuracy | Lambda/10 @ 633nm |
Applications and Measurements | Transmittance and reflectance measurement of planar components |
wavelength range | UV/VIS/IR (185nm ~ 3300nm) |
UVVis sub-band resolution | ≤0.05nm |
Infrared band resolution | ≤0.20nm |
Stray light@220nm& 340nm&370nm | ≤0.00007%T |
wavelength repeatability | ≤0.20nm |